Modern interferometry for length metrology : exploring limits and novel techniques / Ren�e Sch�odel (editor).
Material type:
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|---|
E-Books | MEF eKitap Kütüphanesi | IOP Science eBook - EBA | QC102 .M645 2018eb (Browse shelf (Opens below)) | Available | IOP_20210100 |
"Version: 20181201"--Title page verso.
Includes bibliographical references.
1. Practical realisation of the length by interferometry-general principles and limitations -- 1.1. A short history of the metre and the present definition -- 1.2. Realisation of the length by direct measurement of the light travelling time (tim
2. Large field imaging interferometry for the measurement of the length of bar shaped material measures -- 2.1. Introduction -- 2.2. Topography-based measurement of the interference phase and extraction of the fractional order of interference --
3. Fizeau interferometry for the sub-nm accurate realisation of sphere radii -- 3.1. A brief history -- 3.2. The measurement principle -- 3.3. Optical interference -- 3.4. Experimental implementation at PTB -- 3.5. Outlook
4. Laser interferometry for high resolution metrology in space -- 4.1. Introduction -- 4.2. Interferometric distance and tilt metrology -- 4.3. Space-based gravitational wave detection -- 4.4. Mapping Earth's gravitational field using satellite-
5. Interferometry in air with refractive index compensation -- 5.1. The index of refraction -- 5.2. Determining the intrinsic parameters -- 5.3. Dispersive intrinsic refractivity compensation -- 5.4. Air wavelength stabilisation -- 5.5. Conclusi
6. Frequency comb based spectral interferometry and homodyne many-wavelength interferometry for distance measurements -- 6.1. Introduction to frequency comb lasers and their applications to dimensional metrology -- 6.2. Distance measurement base
7. Distance measurements using mode-locked pulse lasers -- 7.1. Introduction -- 7.2. Comb-referenced multi-wavelength interferometer -- 7.3. Comb-based dispersive interferometry -- 7.4. Time-of-flight measurement by pulse-to-pulse cross-correlat
8. Absolute distance measurement using frequency scanning interferometry -- 8.1. Introduction -- 8.2. Physical description of FSI interferometers -- 8.3. FSI analysis techniques -- 8.4. FSI hardware technology
9. Picometre level displacement interferometry -- 9.1. Influences of the laser light source -- 9.2. Correction of the refractive index -- 9.3. Length-proportional error resulting for beam diffraction -- 9.4. Conclusion.
Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the fields of length and distance metrology. The representation of a length according to t
Also available in print.
Mode of access: World Wide Web.
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Modern Interferometry for Length Metrology: Exploring limits and novel techniques has been written by leading experts within the field of metrology and edited by Dr. Ren�e Sch�odel who is the head of The Department of Interferometry on
Title from PDF title page (viewed on January 16, 2019).